Answers to fundamental questions in superresolution microscopy.

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Abstrakt

Tytuł:: Answers to fundamental questions in superresolution microscopy.
Autorzy:: Heintzmann R; Leibniz Institute of Photonic Technology, Albert-Einstein-Strasse 9, 07745 Jena, Germany.; Institute of Physical Chemistry and Abbe Center of Photonics, Friedrich-Schiller-University, Helmholtzweg 4, Jena, Germany.
Źródło:: Philosophical transactions. Series A, Mathematical, physical, and engineering sciences [Philos Trans A Math Phys Eng Sci] 2021 Jun 14; Vol. 379 (2199), pp. 20210105. Date of Electronic Publication: 2021 Apr 26.
Typ publikacji:: Journal Article
Język:: English
Imprint Name(s):: Original Publication: London : The Royal Society, c1996-
MeSH Terms:: Microscopy, Fluorescence/*methods
Algorithms ; Animals ; Fourier Analysis ; Humans ; Image Processing, Computer-Assisted/methods ; Image Processing, Computer-Assisted/statistics & numerical data ; Light ; Machine Learning ; Microscopy, Fluorescence/instrumentation ; Microscopy, Fluorescence/statistics & numerical data ; Nonlinear Dynamics ; Optical Phenomena ; Single Molecule Imaging/instrumentation ; Single Molecule Imaging/methods ; Single Molecule Imaging/statistics & numerical data
Contributed Indexing:: Keywords: Abbe limit; nonlinear structured illumination microscopy; stimulated emission depletion; structured illumination microscopy; superresolution
Entry Date(s):: Date Created: 20210426 Date Completed: 20210915 Latest Revision: 20210915
Update Code:: 20240104
DOI:: 10.1098/rsta.2021.0105
PMID:: 33896198
: Czasopismo naukowe

This article presents answers to the questions on superresolution and structured illumination microscopy (SIM) as raised in the editorial of this collection of articles (https://doi.org/10.1098/rsta.2020.0143). These answers are based on my personal views on superresolution in light microscopy, supported by reasoning. Discussed are the definition of superresolution, Abbe's resolution limit and the classification of superresolution methods into nonlinear-, prior knowledge- and near-field-based superresolution. A further focus is put on the capabilities and technical aspects of present and future SIM methods. This article is part of the Theo Murphy meeting issue 'Super-resolution structured illumination microscopy (part 1)'.

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