Electron emission and capture by oxygen-related bistable thermal double donors in silicon studied with junction capacitance techniques.

It has been recently suggested that oxygen-related bistable thermal double donors (BTDDs) are responsible for the reduction of minority carrier lifetime and conversion efficiency of novel amorphous-crystalline Si heterojunction solar cells with their base formed from n-type Czochralski-grown (Cz) silicon [M. Tomassini et al., J. Appl. Phys. 119, 084508 (2016)]. To test this hypothesis, we have studied processes associated with carrier emission and capture by BTDDs in p+-n and Schottky barrier diodes on n-type Cz-Si materials with the use of junction capacitance techniques. By means of deep level transient spectroscopy, we have detected electron emission signals from the deep donor state of the BTDD-0 and BTDD-1 centers. The values of activation energy for electron emission (Eem) have been determined as 1.01 ± 0.01 and 0.91 ± 0.01 eV for the BTDD-0 and BTDD-1 centers, respectively. Such high Eem values are very unusual for defects in Si. We have carried out measurements of electron capture kinetics and associated shallow donor–deep donor transformations for the BTDD-0 and BTDD-1 defects at different temperatures in the diodes with different doping levels. Energy barriers for the capture-transformation processes have been determined. It is argued that BTDDs are responsible for carrier trapping in n-type Cz-Si crystals but are not effective recombination centers. [ABSTRACT FROM AUTHOR]
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