Structure and surface elemental state analysis of polyimide resin film after carbonization and graphitization.

This article discusses a study which examined the properties of carbon materials prepared from polyimide (PI) resin films. The study used TG-DTG, X-ray powder diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) analysis in the examination. It showed the occurrence of the weight loss of the films during carbonization. It also found some characteristics of nongraphitizing carbon exhibited by the films.