- Tytuł:
- Optical, Structural and Electrical Properties of Aluminum Doped Zinc Oxide Thin Films by MOCVD Technique.
- Autorzy:
- Temat:
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ZINC oxide thin films
ALUMINUM compounds
RUTHERFORD backscattering spectrometry
ENERGY dispersive X-ray spectroscopy
X-ray diffraction - Źródło:
- Journal of Electronic Materials; Jun2019, Vol. 48 Issue 6, p3655-3661, 7p, 1 Black and White Photograph, 1 Diagram, 1 Chart, 3 Graphs
Czasopismo naukowe