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Wyszukujesz frazę ""Chang, Ki Soo"" wg kryterium: Autor


Tytuł :
Microlensed dual-fiber probe for depth-resolved fluorescence measurements.
Autorzy :
Choi HY; Division of Instrument Development, Korea Basic Science Institute, 113 Gwahangno, Yusung-gu, Daejeon 305-333, Korea.
Ryu SY
Kim JY
Kim GH
Park SJ
Lee BH
Chang KS
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Źródło :
Optics express [Opt Express] 2011 Jul 18; Vol. 19 (15), pp. 14172-81.
Typ publikacji :
Journal Article; Research Support, Non-U.S. Gov't
MeSH Terms :
Lenses*
Optical Fibers*
Luminescent Measurements/*methods
Computer Simulation ; Molecular Probes ; Phantoms, Imaging ; Spectrometry, Fluorescence
Czasopismo naukowe
Tytuł :
Precise temperature mapping of GaN-based LEDs by quantitative infrared micro-thermography.
Autorzy :
Chang KS; Division of Instrument Development, Korea Basic Science Institute, Daejeon, Korea. />Yang SC
Kim JY
Kook MH
Ryu SY
Choi HY
Kim GH
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Źródło :
Sensors (Basel, Switzerland) [Sensors (Basel)] 2012; Vol. 12 (4), pp. 4648-60. Date of Electronic Publication: 2012 Apr 10.
Typ publikacji :
Journal Article
Czasopismo naukowe
Tytuł :
Simultaneous multicolor imaging of wide-field epi-fluorescence microscopy with four-bucket detection.
Autorzy :
Park KS; Division of Scientific Instrumentation, Korea Basic Science Institute, 169-148 Gwahak-ro Yuseong-gu, Daejeon 34133, South Korea.
Kim DU; Division of Scientific Instrumentation, Korea Basic Science Institute, 169-148 Gwahak-ro Yuseong-gu, Daejeon 34133, South Korea.
Lee J; Division of Scientific Instrumentation, Korea Basic Science Institute, 169-148 Gwahak-ro Yuseong-gu, Daejeon 34133, South Korea.
Kim GH; Division of Scientific Instrumentation, Korea Basic Science Institute, 169-148 Gwahak-ro Yuseong-gu, Daejeon 34133, South Korea.
Chang KS; Division of Scientific Instrumentation, Korea Basic Science Institute, 169-148 Gwahak-ro Yuseong-gu, Daejeon 34133, South Korea.
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Źródło :
Biomedical optics express [Biomed Opt Express] 2016 May 19; Vol. 7 (6), pp. 2285-94. Date of Electronic Publication: 2016 May 19 (Print Publication: 2016).
Typ publikacji :
Journal Article
Czasopismo naukowe
Tytuł :
Electric Field-aided Selective Activation for Indium-Gallium-Zinc-Oxide Thin Film Transistors.
Autorzy :
Lee H; School of Electrical and Electronic Engineering, Yonsei University, 50 Yonsei-ro, Seodaemun-gu, Seoul 120-749, Republic of Korea.
Chang KS; Division of Scientific Instrumentation, Korea Basic Science Institute, 169-148 Gwahak-ro, Yuseong-gu, Daejeon 305-806, Republic of Korea.
Tak YJ; School of Electrical and Electronic Engineering, Yonsei University, 50 Yonsei-ro, Seodaemun-gu, Seoul 120-749, Republic of Korea.
Jung TS; School of Electrical and Electronic Engineering, Yonsei University, 50 Yonsei-ro, Seodaemun-gu, Seoul 120-749, Republic of Korea.
Park JW; School of Electrical and Electronic Engineering, Yonsei University, 50 Yonsei-ro, Seodaemun-gu, Seoul 120-749, Republic of Korea.
Kim WG; School of Electrical and Electronic Engineering, Yonsei University, 50 Yonsei-ro, Seodaemun-gu, Seoul 120-749, Republic of Korea.
Chung J; School of Electrical and Electronic Engineering, Yonsei University, 50 Yonsei-ro, Seodaemun-gu, Seoul 120-749, Republic of Korea.
Jeong CB; Division of Scientific Instrumentation, Korea Basic Science Institute, 169-148 Gwahak-ro, Yuseong-gu, Daejeon 305-806, Republic of Korea.
Kim HJ; School of Electrical and Electronic Engineering, Yonsei University, 50 Yonsei-ro, Seodaemun-gu, Seoul 120-749, Republic of Korea.
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Źródło :
Scientific reports [Sci Rep] 2016 Oct 11; Vol. 6, pp. 35044. Date of Electronic Publication: 2016 Oct 11.
Typ publikacji :
Journal Article; Research Support, Non-U.S. Gov't
Czasopismo naukowe
Tytuł :
Functional Design of Dielectric-Metal-Dielectric-Based Thin-Film Encapsulation with Heat Transfer and Flexibility for Flexible Displays.
Autorzy :
Kwon JH; School of Electrical Engineering, KAIST , Daejeon 34141, Republic of Korea.
Choi S; School of Electrical Engineering, KAIST , Daejeon 34141, Republic of Korea.
Jeon Y; School of Electrical Engineering, KAIST , Daejeon 34141, Republic of Korea.
Kim H; School of Electrical Engineering, KAIST , Daejeon 34141, Republic of Korea.
Chang KS; Division of Instrument Development, Korea Basic Science Institute , Daejeon 34133, Republic of Korea.
Choi KC; School of Electrical Engineering, KAIST , Daejeon 34141, Republic of Korea.
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Źródło :
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2017 Aug 16; Vol. 9 (32), pp. 27062-27072. Date of Electronic Publication: 2017 Aug 02.
Typ publikacji :
Journal Article
Czasopismo naukowe
Tytuł :
Laser Scanning Confocal Thermoreflectance Microscope for the Backside Thermal Imaging of Microelectronic Devices.
Autorzy :
Kim DU; Division of Scientific Instrumentation, Korea Basic Science Institute, 169-148 Gwahak-ro, Yuseong-gu, Daejeon 34133, Korea. .
Jeong CB; Division of Scientific Instrumentation, Korea Basic Science Institute, 169-148 Gwahak-ro, Yuseong-gu, Daejeon 34133, Korea. .
Kim JD; Division of Scientific Instrumentation, Korea Basic Science Institute, 169-148 Gwahak-ro, Yuseong-gu, Daejeon 34133, Korea. .
Lee KS; Division of Scientific Instrumentation, Korea Basic Science Institute, 169-148 Gwahak-ro, Yuseong-gu, Daejeon 34133, Korea. .
Hur H; Division of Scientific Instrumentation, Korea Basic Science Institute, 169-148 Gwahak-ro, Yuseong-gu, Daejeon 34133, Korea. .
Nam KH; Division of Scientific Instrumentation, Korea Basic Science Institute, 169-148 Gwahak-ro, Yuseong-gu, Daejeon 34133, Korea. .
Kim GH; Division of Scientific Instrumentation, Korea Basic Science Institute, 169-148 Gwahak-ro, Yuseong-gu, Daejeon 34133, Korea. .
Chang KS; Division of Scientific Instrumentation, Korea Basic Science Institute, 169-148 Gwahak-ro, Yuseong-gu, Daejeon 34133, Korea. .
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Źródło :
Sensors (Basel, Switzerland) [Sensors (Basel)] 2017 Nov 30; Vol. 17 (12). Date of Electronic Publication: 2017 Nov 30.
Typ publikacji :
Journal Article
Czasopismo naukowe

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