- Tytuł:
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DLTS and in situ C-V analysis of trap parameters in swift 50 MeV Li3+ ion-irradiated Ni/SiO2/Si MOS capacitors. - Autorzy:
- Źródło:
- Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena. Apr2011, Vol. 166 Issue 4, p313-322. 10p. 2 Charts, 7 Graphs.
Czasopismo naukowe