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Wyszukujesz frazę ""Deng, Longjiang"" wg kryterium: Autor


Wyświetlanie 1-6 z 6
Tytuł :
Thickness-dependent Magnetic and Microwave Resonance Characterization of Combined Stripe Patterned FeCoBSi Films.
Autorzy :
Zhang L; State Key Laboratory of Electronic Thin films and Integrated Devices, National Engineering Research Center of Electromagnetic Radiation Control Materials, Key Laboratory of Multi-spectral Absorbing Materials and Structures of Ministry of Education, Chengdu, 610054, China. .; School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 610054, China. .
Liu Y; State Key Laboratory of Electronic Thin films and Integrated Devices, National Engineering Research Center of Electromagnetic Radiation Control Materials, Key Laboratory of Multi-spectral Absorbing Materials and Structures of Ministry of Education, Chengdu, 610054, China.; School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 610054, China.
Zheng H; State Key Laboratory of Electronic Thin films and Integrated Devices, National Engineering Research Center of Electromagnetic Radiation Control Materials, Key Laboratory of Multi-spectral Absorbing Materials and Structures of Ministry of Education, Chengdu, 610054, China.; School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 610054, China.
Zhu W; State Key Laboratory of Electronic Thin films and Integrated Devices, National Engineering Research Center of Electromagnetic Radiation Control Materials, Key Laboratory of Multi-spectral Absorbing Materials and Structures of Ministry of Education, Chengdu, 610054, China.; School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 610054, China.
Zhang M; State Key Laboratory of Electronic Thin films and Integrated Devices, National Engineering Research Center of Electromagnetic Radiation Control Materials, Key Laboratory of Multi-spectral Absorbing Materials and Structures of Ministry of Education, Chengdu, 610054, China.; School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 610054, China.
Zhang L; State Key Laboratory of Electronic Thin films and Integrated Devices, National Engineering Research Center of Electromagnetic Radiation Control Materials, Key Laboratory of Multi-spectral Absorbing Materials and Structures of Ministry of Education, Chengdu, 610054, China.; School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 610054, China.
Zhou P; State Key Laboratory of Electronic Thin films and Integrated Devices, National Engineering Research Center of Electromagnetic Radiation Control Materials, Key Laboratory of Multi-spectral Absorbing Materials and Structures of Ministry of Education, Chengdu, 610054, China.; School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 610054, China.
Chen H; State Key Laboratory of Electronic Thin films and Integrated Devices, National Engineering Research Center of Electromagnetic Radiation Control Materials, Key Laboratory of Multi-spectral Absorbing Materials and Structures of Ministry of Education, Chengdu, 610054, China.; School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 610054, China.
Wang X; State Key Laboratory of Electronic Thin films and Integrated Devices, National Engineering Research Center of Electromagnetic Radiation Control Materials, Key Laboratory of Multi-spectral Absorbing Materials and Structures of Ministry of Education, Chengdu, 610054, China.; School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 610054, China.
Lu H; State Key Laboratory of Electronic Thin films and Integrated Devices, National Engineering Research Center of Electromagnetic Radiation Control Materials, Key Laboratory of Multi-spectral Absorbing Materials and Structures of Ministry of Education, Chengdu, 610054, China.; School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 610054, China.
Xie J; State Key Laboratory of Electronic Thin films and Integrated Devices, National Engineering Research Center of Electromagnetic Radiation Control Materials, Key Laboratory of Multi-spectral Absorbing Materials and Structures of Ministry of Education, Chengdu, 610054, China.; School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 610054, China.
Deng L; State Key Laboratory of Electronic Thin films and Integrated Devices, National Engineering Research Center of Electromagnetic Radiation Control Materials, Key Laboratory of Multi-spectral Absorbing Materials and Structures of Ministry of Education, Chengdu, 610054, China.; School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 610054, China.
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Źródło :
Nanoscale research letters [Nanoscale Res Lett] 2018 Apr 12; Vol. 13 (1), pp. 97. Date of Electronic Publication: 2018 Apr 12.
Typ publikacji :
Journal Article
Czasopismo naukowe
Tytuł :
Preparation and Angle-Dependent Optical Properties of Brown Al/MnO 2 Composite Pigments in Visible and Infrared Region.
Autorzy :
Liu Y; National Engineering Research Center of Electromagnetic Radiation Control Materials, University of Electronic Science and Technology of China, Chengdu, 610054, People's Republic of China. .; State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054, People's Republic of China. .
Xie J; National Engineering Research Center of Electromagnetic Radiation Control Materials, University of Electronic Science and Technology of China, Chengdu, 610054, People's Republic of China.; State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054, People's Republic of China.
Luo M; National Engineering Research Center of Electromagnetic Radiation Control Materials, University of Electronic Science and Technology of China, Chengdu, 610054, People's Republic of China.; State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054, People's Republic of China.
Peng B; National Engineering Research Center of Electromagnetic Radiation Control Materials, University of Electronic Science and Technology of China, Chengdu, 610054, People's Republic of China.; State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054, People's Republic of China.
Deng L; National Engineering Research Center of Electromagnetic Radiation Control Materials, University of Electronic Science and Technology of China, Chengdu, 610054, People's Republic of China.; State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054, People's Republic of China.
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Źródło :
Nanoscale research letters [Nanoscale Res Lett] 2017 Dec; Vol. 12 (1), pp. 266. Date of Electronic Publication: 2017 Apr 08.
Typ publikacji :
Journal Article
Czasopismo naukowe
Tytuł :
Structural and Visible-Near Infrared Optical Properties of Cr-Doped TiO 2 for Colored Cool Pigments.
Autorzy :
Yuan L; National Engineering Research Center of Electromagnetic Radiation Control Materials, University of Electronic Science and Technology of China, Chengdu, 610054, People's Republic of China.; Key Laboratory of Fluid and Power Machinery of Ministry of Education, Center for Advanced Materials and Energy, Xihua University, Chengdu, 610039, People's Republic of China.
Weng X; National Engineering Research Center of Electromagnetic Radiation Control Materials, University of Electronic Science and Technology of China, Chengdu, 610054, People's Republic of China. .
Zhou M; Key Laboratory of Fluid and Power Machinery of Ministry of Education, Center for Advanced Materials and Energy, Xihua University, Chengdu, 610039, People's Republic of China.
Zhang Q; Key Laboratory of Fluid and Power Machinery of Ministry of Education, Center for Advanced Materials and Energy, Xihua University, Chengdu, 610039, People's Republic of China.
Deng L; National Engineering Research Center of Electromagnetic Radiation Control Materials, University of Electronic Science and Technology of China, Chengdu, 610054, People's Republic of China.
Pokaż więcej
Źródło :
Nanoscale research letters [Nanoscale Res Lett] 2017 Nov 17; Vol. 12 (1), pp. 597. Date of Electronic Publication: 2017 Nov 17.
Typ publikacji :
Journal Article
Czasopismo naukowe
    Wyświetlanie 1-6 z 6

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