- Tytuł:
- Test Bench for Highly Segmented GRIT Double-Sided Silicon Strip Detectors: A Detector Quality Control Protocol.
- Autorzy:
- Źródło:
- Sensors (Basel, Switzerland) [Sensors (Basel)] 2023 Jun 07; Vol. 23 (12). Date of Electronic Publication: 2023 Jun 07.
- Typ publikacji:
- Journal Article
- MeSH Terms:
-
Silicon*
Quality Control
Czasopismo naukowe