- Tytuł:
- Nanomechanical Characterization of Vertical Nanopillars Using an MEMS-SPM Nano-Bending Testing Platform.
- Autorzy:
- Temat:
-
BENDING (Metalwork)
DIGITAL image correlation
SCANNING probe microscopy
QUALITY control
MICROELECTROMECHANICAL systems
SCANNING systems - Źródło:
-
Sensors (14248220) ; Oct2019, Vol. 19 Issue 20, p4529, 1p
Czasopismo naukowe