- Tytuł:
- CHEMICAL AND PHISICAL CHARACTERIZATION OF MEMORY BOARDS FROM OBSOLETE COMPUTERS THROUGH OPTICAL EMISSION SPECTROMETRY AND SCANNING ELECTRON MICROSCOPY.
- Autorzy:
- Źródło:
- Tecnologia em Metalurgia, Materiais e Mineração. apr-jun2019, Vol. 16 Issue 2, p212-221. 10p.
Czasopismo naukowe