- Tytuł:
- Mapping TES Temperature Sensitivity and Current Sensitivity as a Function of Temperature, Current, and Magnetic Field with IV curve and Complex Admittance Measurements.
- Autorzy:
- Źródło:
- Journal of low temperature physics [J Low Temp Phys] 2018 Nov; Vol. 193 (3-4), pp. 321-327. Date of Electronic Publication: 2018 May 29.
- Typ publikacji:
- Journal Article
Czasopismo naukowe