- Tytuł:
- Study of Silicon and the Transition Layer between Titanium and Titanium Oxide by Laser-Assisted Atom Probe Tomography.
- Autorzy:
- Źródło:
- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques; Sep2020, Vol. 14 Issue 5, p882-888, 7p
Czasopismo naukowe