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You search for a phrase ""Takakura, K."" according to the criterion: Author


Title :
Impact of electrical stress on the electrical characteristics of 2 MeV electron irradiated metal-oxide-silicon capacitors with atomic layer deposited Al2O3, HfO2 and nanolaminated dielectrics
Authors :
Rafí, J.M.
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Source :
In Solid State Electronics November 2013 89:198-206
Academic Journal
Title :
2 MeV electron irradiation effects on the electrical characteristics of MOS capacitors with ALD Al2O3 dielectrics of different thickness
Authors :
Rafí, J.M.
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Source :
In European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Microelectronics Reliability September-November 2013 53(9-11):1333-1337
Academic Journal
Title :
2 MeV electron irradiation effects on bulk and interface of atomic layer deposited high-k gate dielectrics on silicon
Authors :
García, H.
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Source :
In Thin Solid Films 1 May 2013 534:482-487
Academic Journal
Title :
2 MeV electron irradiation effects on the electrical characteristics of metal–oxide–silicon capacitors with atomic layer deposited Al2O3, HfO2 and nanolaminated dielectrics
Authors :
Rafí, J.M.
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Source :
In Solid State Electronics January 2013 79:65-74
Academic Journal
Title :
Radiation damage of Si1-xGex S/D p-type metal oxide semiconductor field effect transistor with different Ge concentrations
Authors :
Nakashima, T.
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Source :
In ICSI-7, Thin Solid Films 1 February 2012 520(8):3337-3340
Academic Journal
Title :
Evaluation of electron irradiated embedded SiGe source/drain diodes by Raman spectroscopy
Authors :
Ohyama, H.
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Source :
In Post-Si-CMOS electronic devices: the role of Ge and III-V materials, Microelectronic Engineering 2011 88(4):484-487
Academic Journal
Title :
Optical and electrical properties of electron-irradiated Cu(In,Ga)Se 2 solar cells
Authors :
Hirose, Y.
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Source :
In Proceedings of the EMRS 2010 Spring Meeting Symposium M: Thin Film Chalcogenide Photovoltaic Materials, Thin Solid Films 2011 519(21):7321-7323
Academic Journal
Title :
Device performance of p-Ge MOSFETs at liquid nitrogen temperature
Authors :
Ohyama, H.
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Source :
In Proceedings of the EMRS 2009 Spring Meeting Symposium I: Silicon and germanium issues for future CMOS devices, Thin Solid Films 2010 518(9):2513-2516
Academic Journal
Title :
Effects of electron irradiation on SiGe devices
Authors :
Ohyama, H.
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Source :
In Proceedings of the EMRS 2009 Spring Meeting Symposium I: Silicon and germanium issues for future CMOS devices, Thin Solid Films 2010 518(9):2517-2520
Academic Journal

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