Energy Calibration of Nonlinear Microcalorimeters with Uncertainty Estimates from Gaussian Process Regression.
Autorzy:
Fowler JW; National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA.; Department of Physics, University of Colorado, Boulder, CO 80309, USA. Alpert BK; National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA. O'Neil GC; National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA. Swetz DS; National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA. UllomJN; National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA.; Department of Physics, University of Colorado, Boulder, CO 80309, USA.
Demonstration of 220/280 GHz Multichroic Feedhorn-Coupled TES Polarimeter.
Autorzy:
Walker S; University of Colorado Boulder, Boulder, CO, USA.; National Institute of Standards and Technology, Boulder, CO, USA. Sierra CE; University of Michigan, Ann Arbor, MI, USA. Austermann JE; National Institute of Standards and Technology, Boulder, CO, USA. Beall JA; National Institute of Standards and Technology, Boulder, CO, USA. Becker DT; University of Colorado Boulder, Boulder, CO, USA.; National Institute of Standards and Technology, Boulder, CO, USA. Dober BJ; National Institute of Standards and Technology, Boulder, CO, USA. Duff SM; National Institute of Standards and Technology, Boulder, CO, USA. Hilton GC; National Institute of Standards and Technology, Boulder, CO, USA. Hubmayr J; National Institute of Standards and Technology, Boulder, CO, USA. Van Lanen JL; National Institute of Standards and Technology, Boulder, CO, USA. McMahon JJ; University of Michigan, Ann Arbor, MI, USA. Simon SM; University of Michigan, Ann Arbor, MI, USA. UllomJN; University of Colorado Boulder, Boulder, CO, USA.; National Institute of Standards and Technology, Boulder, CO, USA. Vissers MR; National Institute of Standards and Technology, Boulder, CO, USA.
A Robust Principal Component Analysis for Outlier Identification in Messy Microcalorimeter Data.
Autorzy:
Fowler JW; Quantum Sensors Group, National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA.; Department of Physics, University of Colorado, Boulder, CO 80309, USA. Alpert BK; Quantum Sensors Group, National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA. Joe YI; Quantum Sensors Group, National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA.; Department of Physics, University of Colorado, Boulder, CO 80309, USA. O'Neil GC; Quantum Sensors Group, National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA. Swetz DS; Quantum Sensors Group, National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA. UllomJN; Quantum Sensors Group, National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA.; Department of Physics, University of Colorado, Boulder, CO 80309, USA.
Expanding the Capability of Microwave Multiplexed Readout for Fast Signals in Microcalorimeters.
Autorzy:
Morgan KM; Department of Physics, University of Colorado Boulder, Boulder, CO 80309, USA.; National Institute of Standards and Technology, Boulder, CO 80305, USA. Becker DT; Department of Physics, University of Colorado Boulder, Boulder, CO 80309, USA.; National Institute of Standards and Technology, Boulder, CO 80305, USA. Bennett DA; National Institute of Standards and Technology, Boulder, CO 80305, USA. Gard JD; Department of Physics, University of Colorado Boulder, Boulder, CO 80309, USA.; National Institute of Standards and Technology, Boulder, CO 80305, USA. Imrek J; Department of Physics, University of Colorado Boulder, Boulder, CO 80309, USA.; National Institute of Standards and Technology, Boulder, CO 80305, USA. Mates JAB; Department of Physics, University of Colorado Boulder, Boulder, CO 80309, USA.; National Institute of Standards and Technology, Boulder, CO 80305, USA. Pappas CG; Department of Physics, University of Colorado Boulder, Boulder, CO 80309, USA.; National Institute of Standards and Technology, Boulder, CO 80305, USA. Reintsema CD; National Institute of Standards and Technology, Boulder, CO 80305, USA. Schmidt DR; National Institute of Standards and Technology, Boulder, CO 80305, USA. UllomJN; Department of Physics, University of Colorado Boulder, Boulder, CO 80309, USA.; National Institute of Standards and Technology, Boulder, CO 80305, USA. Weber J; Department of Physics, University of Colorado Boulder, Boulder, CO 80309, USA.; National Institute of Standards and Technology, Boulder, CO 80305, USA. Wessels A; Department of Physics, University of Colorado Boulder, Boulder, CO 80309, USA. Swetz DS; National Institute of Standards and Technology, Boulder, CO 80305, USA.
A 300-mK Test Bed for Rapid Characterization of Microwave SQUID Multiplexing Circuits.
Autorzy:
Wessels AL; University of Colorado, Boulder, CO 80303, USA. Becker DT; University of Colorado, Boulder, CO 80303, USA. Bennett DA; National Institute of Standards and Technology, Boulder, CO 80303, USA. Gard JD; University of Colorado, Boulder, CO 80303, USA. Hubmayr J; National Institute of Standards and Technology, Boulder, CO 80303, USA. Jarosik N; Princeton University, Princeton, NJ 08544, USA. Kotsubo VY; National Institute of Standards and Technology, Boulder, CO 80303, USA. Mates JAB; University of Colorado, Boulder, CO 80303, USA. UllomJN; University of Colorado, Boulder, CO 80303, USA.; National Institute of Standards and Technology, Boulder, CO 80303, USA.
Millimeter-Wave Polarimeters Using Kinetic Inductance Detectors for TolTEC and Beyond.
Autorzy:
Austermann JE; Quantum Sensors Group, National Institute of Standards and Technology; Boulder, CO 80305, USA. Beall JA; Quantum Sensors Group, National Institute of Standards and Technology; Boulder, CO 80305, USA. Bryan SA; Arizona State University, Tempe, AZ. Dober B; Quantum Sensors Group, National Institute of Standards and Technology; Boulder, CO 80305, USA. Gao J; Quantum Sensors Group, National Institute of Standards and Technology; Boulder, CO 80305, USA. Hilton G; Quantum Sensors Group, National Institute of Standards and Technology; Boulder, CO 80305, USA. Hubmayr J; Quantum Sensors Group, National Institute of Standards and Technology; Boulder, CO 80305, USA. Mauskopf P; Arizona State University, Tempe, AZ. McKenney CM; Quantum Sensors Group, National Institute of Standards and Technology; Boulder, CO 80305, USA. Simon SM; University of Michigan, Ann Arbor, MI. UllomJN; Quantum Sensors Group, National Institute of Standards and Technology; Boulder, CO 80305, USA. Vissers MR; Quantum Sensors Group, National Institute of Standards and Technology; Boulder, CO 80305, USA. Wilson GW; University of Massachusetts, Amherst, MA.
Developments in Time-Division Multiplexing of X-ray Transition-Edge Sensors.
Autorzy:
Doriese WB; National Institute of Standards and Technology, Boulder, CO 80305, USA. Morgan KM; National Institute of Standards and Technology, Boulder, CO 80305, USA. Bennett DA; National Institute of Standards and Technology, Boulder, CO 80305, USA. Denison EV; National Institute of Standards and Technology, Boulder, CO 80305, USA. Fitzgerald CP; National Institute of Standards and Technology, Boulder, CO 80305, USA. Fowler JW; National Institute of Standards and Technology, Boulder, CO 80305, USA. Gard JD; National Institute of Standards and Technology, Boulder, CO 80305, USA. Hays-Wehle JP; National Institute of Standards and Technology, Boulder, CO 80305, USA. Hilton GC; National Institute of Standards and Technology, Boulder, CO 80305, USA. Irwin KD; Stanford University Department of Physics, Stanford, CA 94305, USA. Joe YI; National Institute of Standards and Technology, Boulder, CO 80305, USA. Mates JA; National Institute of Standards and Technology, Boulder, CO 80305, USA. O'Neil GC; National Institute of Standards and Technology, Boulder, CO 80305, USA. Reintsema CD; National Institute of Standards and Technology, Boulder, CO 80305, USA. Robbins NO; National Institute of Standards and Technology, Boulder, CO 80305, USA. Schmidt DR; National Institute of Standards and Technology, Boulder, CO 80305, USA. Swetz DS; National Institute of Standards and Technology, Boulder, CO 80305, USA. Tatsuno H; National Institute of Standards and Technology, Boulder, CO 80305, USA. Vale LR; National Institute of Standards and Technology, Boulder, CO 80305, USA. UllomJN; National Institute of Standards and Technology, Boulder, CO 80305, USA.
Fowler JW; National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA. Alpert BK; National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA. Doriese WB; National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA. Joe YI; National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA. O'Neil GC; National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA. UllomJN; National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA. Swetz DS; National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA.
High-resolution X-ray emission spectroscopy with transition-edge sensors: present performance and future potential.
Autorzy:
Uhlig J; Department of Chemical Physics, Lund University, Lund, Sweden. Doriese WB; National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA. Fowler JW; National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA. Swetz DS; National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA. Jaye C; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA. Fischer DA; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA. Reintsema CD; National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA. Bennett DA; National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA. Vale LR; National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA. Mandal U; Department of Chemical Physics, Lund University, Lund, Sweden. O'Neil GC; National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA. Miaja-Avila L; National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA. Joe YI; National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA. El Nahhas A; Department of Chemical Physics, Lund University, Lund, Sweden. Fullagar W; Department of Chemical Physics, Lund University, Lund, Sweden. Gustafsson FP; Department of Chemical Physics, Lund University, Lund, Sweden. Sundström V; Department of Chemical Physics, Lund University, Lund, Sweden. Kurunthu D; Department of Chemical Physics, Lund University, Lund, Sweden. Hilton GC; National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA. Schmidt DR; National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA. UllomJN; National Institute of Standards and Technology, 325 Broadway, MS 817.03, Boulder, CO 80305, USA.
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Źródło:
Journal of synchrotron radiation [J Synchrotron Radiat] 2015 May; Vol. 22 (3), pp. 766-75. Date of Electronic Publication: 2015 Apr 21.
Typ publikacji:
Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S.
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