- Tytuł :
- A contrast in the electronic structures of B ion implanted ZnO thin films grown on glass and silicon substrates by using x-ray absorption spectroscopy.
- Autorzy :
- Temat :
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SECONDARY ion mass spectrometry
THIN films
ACCELERATOR mass spectrometry
ZINC oxide films
X-ray absorption
ELECTRONIC structure
EXTENDED X-ray absorption fine structure
X-ray spectroscopy - Źródło :
- Journal of Applied Physics; 8/14/2020, Vol. 128 Issue 6, p1-7, 7p, 5 Graphs
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Czasopismo naukowe