- Tytuł:
- Extremely thin layer plastification for focused‐ion beam scanning electron microscopy: an improved method to study cell surfaces and organelles of cultured cells.
- Autorzy:
- Źródło:
- Journal of Microscopy. Jun2018, Vol. 270 Issue 3, p359-373. 15p. 4 Diagrams, 1 Chart, 1 Graph.
Czasopismo naukowe