Informacja

Drogi użytkowniku, aplikacja do prawidłowego działania wymaga obsługi JavaScript. Proszę włącz obsługę JavaScript w Twojej przeglądarce.

Wyszukujesz frazę ""Mezza, D."" wg kryterium: Wszystkie pola


Tytuł:
Quantum Efficiency Measurement and Modeling of Silicon Sensors Optimized for Soft X-ray Detection.
Autorzy:
Carulla M; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Barten R; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Baruffaldi F; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Bergamaschi A; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Borghi G; Fondazione Bruno Kessler, Via Sommarive 18, 38126 Povo, Italy.
Boscardin M; Fondazione Bruno Kessler, Via Sommarive 18, 38126 Povo, Italy.
Brückner M; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Butcher TA; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Centis Vignali M; Fondazione Bruno Kessler, Via Sommarive 18, 38126 Povo, Italy.
Dinapoli R; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Ebner S; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Ficorella F; Fondazione Bruno Kessler, Via Sommarive 18, 38126 Povo, Italy.
Fröjdh E; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Greiffenberg D; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Hammad Ali O; Fondazione Bruno Kessler, Via Sommarive 18, 38126 Povo, Italy.
Hasanaj S; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Heymes J; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Hinger V; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
King T; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Kozlowski P; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Lopez Cuenca C; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Mezza D; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Moustakas K; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Mozzanica A; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Paternoster G; Fondazione Bruno Kessler, Via Sommarive 18, 38126 Povo, Italy.
Paton KA; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Ronchin S; Fondazione Bruno Kessler, Via Sommarive 18, 38126 Povo, Italy.
Ruder C; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Schmitt B; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Sieberer P; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Thattil D; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Vogelsang K; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Xie X; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Zhang J; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Pokaż więcej
Źródło:
Sensors (Basel, Switzerland) [Sensors (Basel)] 2024 Jan 31; Vol. 24 (3). Date of Electronic Publication: 2024 Jan 31.
Typ publikacji:
Journal Article
Czasopismo naukowe
Tytuł:
The EIGER detector for low-energy electron microscopy and photoemission electron microscopy.
Autorzy:
Tinti, G.
Marchetto, H.
Vaz, C. A. F.
Kleibert, A.
Andrä, M.
Barten, R.
Bergamaschi, A.
Brückner, M.
Cartier, S.
Dinapoli, R.
Franz, T.
Fröjdh, E.
Greiffenberg, D.
Lopez-Cuenca, C.
Mezza, D.
Mozzanica, A.
Nolting, F.
Ramilli, M.
Redford, S.
Ruat, M.
Pokaż więcej
Temat:
DETECTORS
ELECTRON microscopy
PHOTOELECTRON spectroscopy
NANOPARTICLES
RADIATION damage
Źródło:
Journal of Synchrotron Radiation; Sep2017, Vol. 24 Issue 5, p963-974, 11p
Przedsiębiorstwo/ jednostka:
PAUL Scherrer Institut
Czasopismo naukowe
Tytuł:
Characterization of Chromium Compensated GaAs Sensors with the Charge-Integrating JUNGFRAU Readout Chip by Means of a Highly Collimated Pencil Beam.
Autorzy:
Greiffenberg D; PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland.
Andrä M; PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland.
Barten R; PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland.
Bergamaschi A; PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland.
Brückner M; PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland.
Busca P; European Synchrotron Radiation Facility (ESRF), 71 Avenue des Martyrs, F-38043 Grenoble, France.
Chiriotti S; PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland.
Chsherbakov I; R&D Center 'Advanced Electronic Technologies', Tomsk State University (TSU), Lenin Ave 36, RUS-634050 Tomsk, Russia.
Dinapoli R; PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland.
Fajardo P; European Synchrotron Radiation Facility (ESRF), 71 Avenue des Martyrs, F-38043 Grenoble, France.
Fröjdh E; PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland.
Hasanaj S; PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland.
Kozlowski P; PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland.
Lopez Cuenca C; PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland.
Lozinskaya A; R&D Center 'Advanced Electronic Technologies', Tomsk State University (TSU), Lenin Ave 36, RUS-634050 Tomsk, Russia.
Meyer M; PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland.
Mezza D; PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland.
Mozzanica A; PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland.
Redford S; PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland.
Ruat M; European Synchrotron Radiation Facility (ESRF), 71 Avenue des Martyrs, F-38043 Grenoble, France.
Ruder C; PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland.
Schmitt B; PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland.
Thattil D; PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland.
Tinti G; PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland.
Tolbanov O; R&D Center 'Advanced Electronic Technologies', Tomsk State University (TSU), Lenin Ave 36, RUS-634050 Tomsk, Russia.
Tyazhev A; R&D Center 'Advanced Electronic Technologies', Tomsk State University (TSU), Lenin Ave 36, RUS-634050 Tomsk, Russia.
Vetter S; PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland.
Zarubin A; R&D Center 'Advanced Electronic Technologies', Tomsk State University (TSU), Lenin Ave 36, RUS-634050 Tomsk, Russia.
Zhang J; PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland.
Pokaż więcej
Źródło:
Sensors (Basel, Switzerland) [Sensors (Basel)] 2021 Feb 23; Vol. 21 (4). Date of Electronic Publication: 2021 Feb 23.
Typ publikacji:
Journal Article
Czasopismo naukowe
Tytuł:
Towards hybrid pixel detectors for energy-dispersive or soft X-ray photon science.
Autorzy:
Jungmann-Smith, J. H.
Bergamaschi, A.
Brückner, M.
Cartier, S.
Dinapoli, R.
Greiffenberg, D.
Huthwelker, T.
Maliakal, D.
Mayilyan, D.
Medjoubi, K.
Mezza, D.
Mozzanica, A.
Ramilli, M.
Ruder, Ch.
Schädler, L.
Schmitt, B.
Shi, X.
Tinti, G.
Pokaż więcej
Temat:
PHOTONS
X-ray detection
PIXELS
Źródło:
Journal of Synchrotron Radiation; Mar2016, Vol. 23 Issue 2, p385-394, 9p
Czasopismo naukowe
Tytuł:
Development of low-energy X-ray detectors using LGAD sensors.
Autorzy:
Andrä M; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen PSI, Switzerland.
Zhang J; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen PSI, Switzerland.
Bergamaschi A; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen PSI, Switzerland.
Barten R; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen PSI, Switzerland.
Borca C; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen PSI, Switzerland.
Borghi G; Fondazione Bruno Kessler, Via Sommarive 18, 38123 Trento, Italy.
Boscardin M; Fondazione Bruno Kessler, Via Sommarive 18, 38123 Trento, Italy.
Busca P; European Synchrotron Radiation Facility, Grenoble, France.
Brückner M; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen PSI, Switzerland.
Cartiglia N; INFN Torino, Via Pietro Giuria 1, 10125 Torino, Italy.
Chiriotti S; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen PSI, Switzerland.
Dalla Betta GF; University of Trento, Via Sommarive 9, 38123 Trento, Italy.
Dinapoli R; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen PSI, Switzerland.
Fajardo P; European Synchrotron Radiation Facility, Grenoble, France.
Ferrero M; INFN Torino, Via Pietro Giuria 1, 10125 Torino, Italy.
Ficorella F; Fondazione Bruno Kessler, Via Sommarive 18, 38123 Trento, Italy.
Fröjdh E; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen PSI, Switzerland.
Greiffenberg D; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen PSI, Switzerland.
Huthwelker T; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen PSI, Switzerland.
Lopez-Cuenca C; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen PSI, Switzerland.
Meyer M; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen PSI, Switzerland.
Mezza D; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen PSI, Switzerland.
Mozzanica A; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen PSI, Switzerland.
Pancheri L; University of Trento, Via Sommarive 9, 38123 Trento, Italy.
Paternoster G; Fondazione Bruno Kessler, Via Sommarive 18, 38123 Trento, Italy.
Redford S; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen PSI, Switzerland.
Ruat M; European Synchrotron Radiation Facility, Grenoble, France.
Ruder C; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen PSI, Switzerland.
Schmitt B; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen PSI, Switzerland.
Shi X; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen PSI, Switzerland.
Sola V; INFN Torino, Via Pietro Giuria 1, 10125 Torino, Italy.
Thattil D; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen PSI, Switzerland.
Tinti G; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen PSI, Switzerland.
Vetter S; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen PSI, Switzerland.
Pokaż więcej
Źródło:
Journal of synchrotron radiation [J Synchrotron Radiat] 2019 Jul 01; Vol. 26 (Pt 4), pp. 1226-1237. Date of Electronic Publication: 2019 Jun 18.
Typ publikacji:
Journal Article
Czasopismo naukowe
Tytuł:
The Adaptive Gain Integrating Pixel Detector at the European XFEL.
Autorzy:
Allahgholi A; Deutsches Elektronen Synchrotron, Notkestrasse 85, 22607 Hamburg, Germany.
Becker J; Deutsches Elektronen Synchrotron, Notkestrasse 85, 22607 Hamburg, Germany.
Delfs A; Deutsches Elektronen Synchrotron, Notkestrasse 85, 22607 Hamburg, Germany.
Dinapoli R; Paul Scherrer Institut, 5232 Villigen, Switzerland.
Goettlicher P; Deutsches Elektronen Synchrotron, Notkestrasse 85, 22607 Hamburg, Germany.
Greiffenberg D; Paul Scherrer Institut, 5232 Villigen, Switzerland.
Henrich B; Paul Scherrer Institut, 5232 Villigen, Switzerland.
Hirsemann H; Deutsches Elektronen Synchrotron, Notkestrasse 85, 22607 Hamburg, Germany.
Kuhn M; Deutsches Elektronen Synchrotron, Notkestrasse 85, 22607 Hamburg, Germany.
Klanner R; University of Hamburg, Luruper Chaussee 149, 22761 Hamburg, Germany.
Klyuev A; Deutsches Elektronen Synchrotron, Notkestrasse 85, 22607 Hamburg, Germany.
Krueger H; University of Bonn, Nussallee 12, 53115 Bonn, Germany.
Lange S; Deutsches Elektronen Synchrotron, Notkestrasse 85, 22607 Hamburg, Germany.
Laurus T; Deutsches Elektronen Synchrotron, Notkestrasse 85, 22607 Hamburg, Germany.
Marras A; Deutsches Elektronen Synchrotron, Notkestrasse 85, 22607 Hamburg, Germany.
Mezza D; Paul Scherrer Institut, 5232 Villigen, Switzerland.
Mozzanica A; Paul Scherrer Institut, 5232 Villigen, Switzerland.
Niemann M; Deutsches Elektronen Synchrotron, Notkestrasse 85, 22607 Hamburg, Germany.
Poehlsen J; Deutsches Elektronen Synchrotron, Notkestrasse 85, 22607 Hamburg, Germany.
Schwandt J; University of Hamburg, Luruper Chaussee 149, 22761 Hamburg, Germany.
Sheviakov I; Deutsches Elektronen Synchrotron, Notkestrasse 85, 22607 Hamburg, Germany.
Shi X; Paul Scherrer Institut, 5232 Villigen, Switzerland.
Smoljanin S; Deutsches Elektronen Synchrotron, Notkestrasse 85, 22607 Hamburg, Germany.
Steffen L; Deutsches Elektronen Synchrotron, Notkestrasse 85, 22607 Hamburg, Germany.
Sztuk-Dambietz J; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.
Trunk U; Deutsches Elektronen Synchrotron, Notkestrasse 85, 22607 Hamburg, Germany.
Xia Q; Deutsches Elektronen Synchrotron, Notkestrasse 85, 22607 Hamburg, Germany.
Zeribi M; Deutsches Elektronen Synchrotron, Notkestrasse 85, 22607 Hamburg, Germany.
Zhang J; Paul Scherrer Institut, 5232 Villigen, Switzerland.
Zimmer M; Deutsches Elektronen Synchrotron, Notkestrasse 85, 22607 Hamburg, Germany.
Schmitt B; Paul Scherrer Institut, 5232 Villigen, Switzerland.
Graafsma H; Deutsches Elektronen Synchrotron, Notkestrasse 85, 22607 Hamburg, Germany.
Pokaż więcej
Źródło:
Journal of synchrotron radiation [J Synchrotron Radiat] 2019 Jan 01; Vol. 26 (Pt 1), pp. 74-82. Date of Electronic Publication: 2019 Jan 01.
Typ publikacji:
Journal Article
Czasopismo naukowe
Tytuł:
Experimental capabilities for liquid jet samples at sub-MHz rates at the FXE Instrument at European XFEL.
Autorzy:
Lima, F. A.
Otte, F.
Vakili, M.
Ardana-Lamas, F.
Biednov, M.
Dall'Antonia, F.
Frankenberger, P.
Gawelda, W.
Gelisio, L.
Han, H.
Huang, X.
Jiang, Y.
Kloos, M.
Kluyver, T.
Knoll, M.
Kubicek, K.
Bermudez Macias, I. J.
Schulz, J.
Turkot, O.
Uemura, Y.
Pokaż więcej
Źródło:
Journal of Synchrotron Radiation. Nov2023, Vol. 30 Issue 6, p1168-1182. 15p.
Czasopismo naukowe
Tytuł:
Micrometer-resolution imaging using MÖNCH: towards G 2 -less grating interferometry.
Autorzy:
Cartier S; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
Kagias M; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
Bergamaschi A; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
Wang Z; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
Dinapoli R; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
Mozzanica A; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
Ramilli M; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
Schmitt B; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
Brückner M; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
Fröjdh E; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
Greiffenberg D; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
Mayilyan D; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
Mezza D; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
Redford S; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
Ruder C; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
Schädler L; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
Shi X; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
Thattil D; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
Tinti G; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
Zhang J; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
Stampanoni M; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
Pokaż więcej
Źródło:
Journal of synchrotron radiation [J Synchrotron Radiat] 2016 Nov 01; Vol. 23 (Pt 6), pp. 1462-1473. Date of Electronic Publication: 2016 Oct 17.
Typ publikacji:
Journal Article; Research Support, Non-U.S. Gov't
Czasopismo naukowe

Ta witryna wykorzystuje pliki cookies do przechowywania informacji na Twoim komputerze. Pliki cookies stosujemy w celu świadczenia usług na najwyższym poziomie, w tym w sposób dostosowany do indywidualnych potrzeb. Korzystanie z witryny bez zmiany ustawień dotyczących cookies oznacza, że będą one zamieszczane w Twoim komputerze. W każdym momencie możesz dokonać zmiany ustawień dotyczących cookies