- Tytuł:
-
Analysis of the Interference Effects in
CMOS Image Sensors Caused by Strong Electromagnetic Pulses - Autorzy:
- Temat:
-
cmos image sensor
electromagnetic pulse
failure type
interference threshold
Electrical engineering. Electronics. Nuclear engineering
TK1-9971
Electricity and magnetism
QC501-766 - Źródło:
- Journal of Electromagnetic Engineering and Science, Vol 24, Iss 2, Pp 151-160 (2024)
- Opis pliku:
- electronic resource
- Relacje:
- https://www.jees.kr/upload/pdf/jees-2024-2-r-215.pdf; https://doaj.org/toc/2671-7255; https://doaj.org/toc/2671-7263
- Dostęp URL:
- https://doaj.org/article/dbd50d36ca724e57a96f5faf5a837493  Link otwiera się w nowym oknie
Czasopismo naukowe